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Fundamental principles of engineering nanometrology
Record Type:
Electronic resources : monographic
Author:
LeachR. K.,
Place of Publication:
Oxford, OX
Published:
Elsevier, William Andrew;
Year of Publication:
2014.
Edition:
2nd ed.
Description:
xxi, 361 p.ill. : 25 cm.;
Series:
Micro & nano technologies series
Subject:
Metrology. -
Subject:
Microtechnology. -
Subject:
Nanotechnology. -
Online resource:
http://www.sciencedirect.com/science/book/9781455777532
ISBN:
9781455777532electronic bk.
ISBN:
9781455777532
Fundamental principles of engineering nanometrology
Leach, R. K.
Fundamental principles of engineering nanometrology
/ Richard Leach. - 2nd ed.. - Oxford, OX : Elsevier, William Andrew, 2014.. - xxi, 361 p. ; ill. ; 25 cm.. - (Micro & nano technologies series).
Includes bibliographical references and index..
ISBN 9781455777532ISBN 9781455777532
Metrology.Microtechnology.Nanotechnology.
Fundamental principles of engineering nanometrology
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http://www.sciencedirect.com/science/book/9781455777532
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