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Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology

[NT 42944] Record Type:	[NT 8598] Electronic resources : [NT 40817] monographic
[NT 47348] Title Information:	SPM applications for nanometrology
[NT 47261] Author:	KlapetekPetr,
[NT 47351] Place of Publication:	Amsterdam
[NT 47263] Published:	William Andrew;
[NT 47352] Year of Publication:	2013.
[NT 50960] Edition:	First edition.
[NT 47264] Description:	xi, 321 p.ill. : 25 cm.;
[NT 47298] Series:	Micro & nano technologies series
[NT 47266] Subject:	Scanning probe microscopy. -
[NT 47266] Subject:	Scanning probe microscopy - Data processing. -
[NT 47266] Subject:	Qualitative research - Data processing. -
[NT 51458] Online resource:	http://www.sciencedirect.com/science/book/9781455730582
[NT 50961] ISBN:	9781455730582electronic bk.
[NT 50961] ISBN:	9781455730582

Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology
Klapetek, Petr

Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology / PetrKlapetek. - First edition.. - Amsterdam : William Andrew, 2013.. - xi, 321 p. ; ill. ; 25 cm.. - (Micro & nano technologies series).
Includes bibliographical references and index..
ISBN 9781455730582ISBN 9781455730582
Scanning probe microscopy.Scanning probe microscopyQualitative research -- Data processing. -- Data processing.

Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology
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