Livshits, Pavel.

[NT 60487] Overview

[NT 60478] Works:	1 [NT 60520] works in 1 [NT 60521] publications in 1 [NT 60522] languages

[NT 60480] Titles

New approaches to image processing based failure analysis of nano-scale ULSI devices [NT 59711] by: Livshits, Pavel.; Zalevsky, Zeev.; Gur, Eran. ([NT 8598] Electronic resources)

[NT 60479] Subjects