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[NT 33762] ISBD
Statistical process control for real-world applications
[NT 42944] Record Type:
[NT 1579] Language materials, printed : [NT 40817] monographic
[NT 47261] Author:
LevinsonWilliam A., 1957-
[NT 47351] Place of Publication:
Boca Raton, FL
[NT 47263] Published:
CRC Press;
[NT 47352] Year of Publication:
c2011
[NT 47264] Description:
xxvi, 245 p.ill. : 25 cm.; 3 CD-ROM+
[NT 47266] Subject:
Quality control - Statistical methods. -
[NT 47266] Subject:
Process control - Statistical methods. -
[NT 51398] Summary:
"Picking up where the textbooks usually leave off, this book equips readers to deal with non-normal applications scientifically and to explain the methodology to suppliers and customers. It shows how to handle uncooperative real-world processes that do not follow textbook assumptions. The text explains how to set realistic control limits and calculate meaningful process capability indices for non-normal applications. Higlighting the pitfalls of assuming normality for all processes, the book addresses multivariate systems, nested variation sources, as well as lognormal, gamma, and Weibull distributions"--Provided by publisher
[NT 50961] ISBN:
978-1-4398-2000-1bound
[NT 50961] ISBN:
1-4398-2000-7bound
Statistical process control for real-world applications
Levinson, William A.
Statistical process control for real-world applications
/ William A. Levinson - Boca Raton, FL : CRC Press, c2011. - xxvi, 245 p. ; ill. ; 25 cm..
Includes bibliographical references (p. 237-239) and index..
ISBN 978-1-4398-2000-1ISBN 1-4398-2000-7
Quality control - Statistical methods.Process control - Statistical methods.
Statistical process control for real-world applications
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"Picking up where the textbooks usually leave off, this book equips readers to deal with non-normal applications scientifically and to explain the methodology to suppliers and customers. It shows how to handle uncooperative real-world processes that do not follow textbook assumptions. The text explains how to set realistic control limits and calculate meaningful process capability indices for non-normal applications. Higlighting the pitfalls of assuming normality for all processes, the book addresses multivariate systems, nested variation sources, as well as lognormal, gamma, and Weibull distributions"--Provided by publisher
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嶺東科技大學圖書館
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