| 紀錄類型: |
書目-電子資源
: 單行本
|
| 作者: |
GubiczaJeno, 1969- |
| 其他團體作者: |
IGI Global |
| 面頁冊數: |
PDFs (343 pages) |
| 標題: |
X-ray crystallography. - |
| 標題: |
Applications of X-ray line profile analysis |
| 標題: |
Crystallite size broadening of diffraction line profiles |
| 標題: |
Evaluation methods of line profiles |
| 標題: |
Influence of chemical heterogeneities |
| 標題: |
Kinematical X-ray scattering theory |
| 標題: |
Line profiles caused by planar faults |
| 標題: |
Peak profile evaluation for thin films |
| 標題: |
Strain broadening of X-ray diffractional peaks |
| 標題: |
X-ray line profile analysis for single crystals |
| 電子資源: |
http://services.igi-global.com/resolvedoi/resolve.aspx?doi=10.4018/978-1-4666-5852-3 |
| 附註: |
Content Type: text |
| 摘要註: |
"X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. This book aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis"--Provided by publisher. |
| ISBN: |
9781466658530 |
| ISBN: |
9781466658523 |
| ISBN: |
1466658525 |
| 內容註: |
Fundamentals of kinematical X-ray scattering theory Crystallite size broadening of diffraction line profiles Strain broadening of X-ray diffraction peaks Line profiles caused by planar faults Influence of chemical heterogeneities on line profiles Evaluation methods of line profiles Peak profile evaluation for thin films X-ray line profile analysis for single crystals Practical applications of X-ray line profile analysis. |